PN Junction Depletion Depth with Source VLSI Formula

Fx Copy
LaTeX Copy
P-n Junction Depletion Depth with Source is defined as the region around a p-n junction where charge carriers have been depleted due to the formation of an electric field. Check FAQs
xdS=2[Permitivity-silicon][Permitivity-vacuum]Ø0[Charge-e]NA
xdS - P-n Junction Depletion Depth with Source?Ø0 - Junction Built-in Voltage?NA - Acceptor Concentration?[Permitivity-silicon] - Permittivity of silicon?[Permitivity-vacuum] - Permittivity of vacuum?[Charge-e] - Charge of electron?

PN Junction Depletion Depth with Source VLSI Example

With values
With units
Only example

Here is how the PN Junction Depletion Depth with Source VLSI equation looks like with Values.

Here is how the PN Junction Depletion Depth with Source VLSI equation looks like with Units.

Here is how the PN Junction Depletion Depth with Source VLSI equation looks like.

0.3134Edit=211.78.9E-120.76Edit1.6E-191E+16Edit
You are here -
HomeIcon Home » Category Engineering » Category Electronics » Category VLSI Fabrication » fx PN Junction Depletion Depth with Source VLSI

PN Junction Depletion Depth with Source VLSI Solution

Follow our step by step solution on how to calculate PN Junction Depletion Depth with Source VLSI?

FIRST Step Consider the formula
xdS=2[Permitivity-silicon][Permitivity-vacuum]Ø0[Charge-e]NA
Next Step Substitute values of Variables
xdS=2[Permitivity-silicon][Permitivity-vacuum]0.76V[Charge-e]1E+161/cm³
Next Step Substitute values of Constants
xdS=211.78.9E-12F/m0.76V1.6E-19C1E+161/cm³
Next Step Convert Units
xdS=211.78.9E-12F/m0.76V1.6E-19C1E+221/m³
Next Step Prepare to Evaluate
xdS=211.78.9E-120.761.6E-191E+22
Next Step Evaluate
xdS=3.13423217933622E-07m
Next Step Convert to Output's Unit
xdS=0.313423217933622μm
LAST Step Rounding Answer
xdS=0.3134μm

PN Junction Depletion Depth with Source VLSI Formula Elements

Variables
Constants
Functions
P-n Junction Depletion Depth with Source
P-n Junction Depletion Depth with Source is defined as the region around a p-n junction where charge carriers have been depleted due to the formation of an electric field.
Symbol: xdS
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
Junction Built-in Voltage
Junction Built-in Voltage is defined as the voltage that exists across a semiconductor junction in thermal equilibrium, where no external voltage is applied.
Symbol: Ø0
Measurement: Electric PotentialUnit: V
Note: Value should be greater than 0.
Acceptor Concentration
Acceptor Concentration refers to the concentration of acceptor dopant atoms in a semiconductor material.
Symbol: NA
Measurement: Carrier ConcentrationUnit: 1/cm³
Note: Value should be greater than 0.
Permittivity of silicon
Permittivity of silicon measures its ability to store electrical energy in an electric field, vital in semiconductor technology.
Symbol: [Permitivity-silicon]
Value: 11.7
Permittivity of vacuum
Permittivity of vacuum is a fundamental physical constant that describes the ability of a vacuum to permit the transmission of electric field lines.
Symbol: [Permitivity-vacuum]
Value: 8.85E-12 F/m
Charge of electron
Charge of electron is a fundamental physical constant, representing the electric charge carried by an electron, which is the elementary particle with a negative electric charge.
Symbol: [Charge-e]
Value: 1.60217662E-19 C
sqrt
A square root function is a function that takes a non-negative number as an input and returns the square root of the given input number.
Syntax: sqrt(Number)

Other formulas in VLSI Material Optimization category

​Go Body Effect Coefficient
γ=modu̲s(Vt-Vt0Φs+(Vsb)-Φs)
​Go Channel Charge
Qch=Cg(Vgc-Vt)
​Go Critical Voltage
Vx=ExEch
​Go DIBL Coefficient
η=Vt0-VtVds

How to Evaluate PN Junction Depletion Depth with Source VLSI?

PN Junction Depletion Depth with Source VLSI evaluator uses P-n Junction Depletion Depth with Source = sqrt((2*[Permitivity-silicon]*[Permitivity-vacuum]*Junction Built-in Voltage)/([Charge-e]*Acceptor Concentration)) to evaluate the P-n Junction Depletion Depth with Source, The PN Junction Depletion Depth with Source VLSI formula is defined as the region around a p-n junction where charge carriers have been depleted due to the formation of an electric field. P-n Junction Depletion Depth with Source is denoted by xdS symbol.

How to evaluate PN Junction Depletion Depth with Source VLSI using this online evaluator? To use this online evaluator for PN Junction Depletion Depth with Source VLSI, enter Junction Built-in Voltage 0) & Acceptor Concentration (NA) and hit the calculate button.

FAQs on PN Junction Depletion Depth with Source VLSI

What is the formula to find PN Junction Depletion Depth with Source VLSI?
The formula of PN Junction Depletion Depth with Source VLSI is expressed as P-n Junction Depletion Depth with Source = sqrt((2*[Permitivity-silicon]*[Permitivity-vacuum]*Junction Built-in Voltage)/([Charge-e]*Acceptor Concentration)). Here is an example- 313423.2 = sqrt((2*[Permitivity-silicon]*[Permitivity-vacuum]*0.76)/([Charge-e]*1E+22)).
How to calculate PN Junction Depletion Depth with Source VLSI?
With Junction Built-in Voltage 0) & Acceptor Concentration (NA) we can find PN Junction Depletion Depth with Source VLSI using the formula - P-n Junction Depletion Depth with Source = sqrt((2*[Permitivity-silicon]*[Permitivity-vacuum]*Junction Built-in Voltage)/([Charge-e]*Acceptor Concentration)). This formula also uses Permittivity of silicon, Permittivity of vacuum, Charge of electron constant(s) and Square Root Function function(s).
Can the PN Junction Depletion Depth with Source VLSI be negative?
No, the PN Junction Depletion Depth with Source VLSI, measured in Length cannot be negative.
Which unit is used to measure PN Junction Depletion Depth with Source VLSI?
PN Junction Depletion Depth with Source VLSI is usually measured using the Micrometer[μm] for Length. Meter[μm], Millimeter[μm], Kilometer[μm] are the few other units in which PN Junction Depletion Depth with Source VLSI can be measured.
Copied!