Gate Oxide Thickness after Full Scaling VLSI Formula

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Gate Oxide Thickness after Full Scaling is defined as the new thickness of the oxide layer after reducing dimensions of transistor by keeping electric field constant. Check FAQs
tox'=toxSf
tox' - Gate Oxide Thickness after Full Scaling?tox - Gate Oxide Thickness?Sf - Scaling Factor?

Gate Oxide Thickness after Full Scaling VLSI Example

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With units
Only example

Here is how the Gate Oxide Thickness after Full Scaling VLSI equation looks like with Values.

Here is how the Gate Oxide Thickness after Full Scaling VLSI equation looks like with Units.

Here is how the Gate Oxide Thickness after Full Scaling VLSI equation looks like.

1.3333Edit=2Edit1.5Edit
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Gate Oxide Thickness after Full Scaling VLSI Solution

Follow our step by step solution on how to calculate Gate Oxide Thickness after Full Scaling VLSI?

FIRST Step Consider the formula
tox'=toxSf
Next Step Substitute values of Variables
tox'=2nm1.5
Next Step Convert Units
tox'=2E-9m1.5
Next Step Prepare to Evaluate
tox'=2E-91.5
Next Step Evaluate
tox'=1.33333333333333E-09m
Next Step Convert to Output's Unit
tox'=1.33333333333333nm
LAST Step Rounding Answer
tox'=1.3333nm

Gate Oxide Thickness after Full Scaling VLSI Formula Elements

Variables
Gate Oxide Thickness after Full Scaling
Gate Oxide Thickness after Full Scaling is defined as the new thickness of the oxide layer after reducing dimensions of transistor by keeping electric field constant.
Symbol: tox'
Measurement: LengthUnit: nm
Note: Value should be greater than 0.
Gate Oxide Thickness
Gate Oxide Thickness is defined as the thickness of the insulating layer (oxide) that separates the gate electrode from the semiconductor substrate in a MOSFET.
Symbol: tox
Measurement: LengthUnit: nm
Note: Value should be greater than 0.
Scaling Factor
Scaling factor is defined as the ratio by which the dimensions of the transistor are changed during the design process.
Symbol: Sf
Measurement: NAUnit: Unitless
Note: Value should be greater than 0.

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How to Evaluate Gate Oxide Thickness after Full Scaling VLSI?

Gate Oxide Thickness after Full Scaling VLSI evaluator uses Gate Oxide Thickness after Full Scaling = Gate Oxide Thickness/Scaling Factor to evaluate the Gate Oxide Thickness after Full Scaling, The Gate Oxide Thickness after Full Scaling VLSI formula is defined as the new thickness of the oxide layer after reducing dimensions of transistor by keeping electric field constant. Gate Oxide Thickness after Full Scaling is denoted by tox' symbol.

How to evaluate Gate Oxide Thickness after Full Scaling VLSI using this online evaluator? To use this online evaluator for Gate Oxide Thickness after Full Scaling VLSI, enter Gate Oxide Thickness (tox) & Scaling Factor (Sf) and hit the calculate button.

FAQs on Gate Oxide Thickness after Full Scaling VLSI

What is the formula to find Gate Oxide Thickness after Full Scaling VLSI?
The formula of Gate Oxide Thickness after Full Scaling VLSI is expressed as Gate Oxide Thickness after Full Scaling = Gate Oxide Thickness/Scaling Factor. Here is an example- 1.3E+9 = 2E-09/1.5.
How to calculate Gate Oxide Thickness after Full Scaling VLSI?
With Gate Oxide Thickness (tox) & Scaling Factor (Sf) we can find Gate Oxide Thickness after Full Scaling VLSI using the formula - Gate Oxide Thickness after Full Scaling = Gate Oxide Thickness/Scaling Factor.
Can the Gate Oxide Thickness after Full Scaling VLSI be negative?
No, the Gate Oxide Thickness after Full Scaling VLSI, measured in Length cannot be negative.
Which unit is used to measure Gate Oxide Thickness after Full Scaling VLSI?
Gate Oxide Thickness after Full Scaling VLSI is usually measured using the Nanometer[nm] for Length. Meter[nm], Millimeter[nm], Kilometer[nm] are the few other units in which Gate Oxide Thickness after Full Scaling VLSI can be measured.
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