Depth of Depletion Region Associated with Source evaluator uses Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor)) to evaluate the Source's Depth of Depletion Region, The Depth of Depletion Region Associated with Source formula is defined as The depletion region forms near the source terminal when a voltage is applied to the gate terminal. Source's Depth of Depletion Region is denoted by xdS symbol.
How to evaluate Depth of Depletion Region Associated with Source using this online evaluator? To use this online evaluator for Depth of Depletion Region Associated with Source, enter Built in Junction Potential (Φo) & Doping Concentration of Acceptor (NA) and hit the calculate button.