Depth of Depletion Region Associated with Source Formula

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Source's Depth of Depletion Region is the depletion region forms near the source terminal when a voltage is applied to the gate terminal. Check FAQs
xdS=2[Permitivity-silicon]Φo[Charge-e]NA
xdS - Source's Depth of Depletion Region?Φo - Built in Junction Potential?NA - Doping Concentration of Acceptor?[Permitivity-silicon] - Permittivity of silicon?[Charge-e] - Charge of electron?

Depth of Depletion Region Associated with Source Example

With values
With units
Only example

Here is how the Depth of Depletion Region Associated with Source equation looks like with Values.

Here is how the Depth of Depletion Region Associated with Source equation looks like with Units.

Here is how the Depth of Depletion Region Associated with Source equation looks like.

1.5E+7Edit=211.72Edit1.6E-191.32Edit
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Depth of Depletion Region Associated with Source Solution

Follow our step by step solution on how to calculate Depth of Depletion Region Associated with Source?

FIRST Step Consider the formula
xdS=2[Permitivity-silicon]Φo[Charge-e]NA
Next Step Substitute values of Variables
xdS=2[Permitivity-silicon]2V[Charge-e]1.32electrons/cm³
Next Step Substitute values of Constants
xdS=211.72V1.6E-19C1.32electrons/cm³
Next Step Convert Units
xdS=211.72V1.6E-19C1.3E+6electrons/m³
Next Step Prepare to Evaluate
xdS=211.721.6E-191.3E+6
Next Step Evaluate
xdS=14875814.9060508m
LAST Step Rounding Answer
xdS=1.5E+7m

Depth of Depletion Region Associated with Source Formula Elements

Variables
Constants
Functions
Source's Depth of Depletion Region
Source's Depth of Depletion Region is the depletion region forms near the source terminal when a voltage is applied to the gate terminal.
Symbol: xdS
Measurement: LengthUnit: m
Note: Value should be greater than 0.
Built in Junction Potential
Built in Junction Potential refers to the potential difference or voltage that exists across a semiconductor junction when it is not connected to an external voltage source.
Symbol: Φo
Measurement: Electric PotentialUnit: V
Note: Value should be greater than 0.
Doping Concentration of Acceptor
Doping Concentration of Acceptor refers to the concentration of acceptor atoms intentionally added to a semiconductor material.
Symbol: NA
Measurement: Electron DensityUnit: electrons/cm³
Note: Value should be greater than 0.
Permittivity of silicon
Permittivity of silicon measures its ability to store electrical energy in an electric field, vital in semiconductor technology.
Symbol: [Permitivity-silicon]
Value: 11.7
Charge of electron
Charge of electron is a fundamental physical constant, representing the electric charge carried by an electron, which is the elementary particle with a negative electric charge.
Symbol: [Charge-e]
Value: 1.60217662E-19 C
sqrt
A square root function is a function that takes a non-negative number as an input and returns the square root of the given input number.
Syntax: sqrt(Number)

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How to Evaluate Depth of Depletion Region Associated with Source?

Depth of Depletion Region Associated with Source evaluator uses Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor)) to evaluate the Source's Depth of Depletion Region, The Depth of Depletion Region Associated with Source formula is defined as The depletion region forms near the source terminal when a voltage is applied to the gate terminal. Source's Depth of Depletion Region is denoted by xdS symbol.

How to evaluate Depth of Depletion Region Associated with Source using this online evaluator? To use this online evaluator for Depth of Depletion Region Associated with Source, enter Built in Junction Potential o) & Doping Concentration of Acceptor (NA) and hit the calculate button.

FAQs on Depth of Depletion Region Associated with Source

What is the formula to find Depth of Depletion Region Associated with Source?
The formula of Depth of Depletion Region Associated with Source is expressed as Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor)). Here is an example- 1.5E+7 = sqrt((2*[Permitivity-silicon]*2)/([Charge-e]*1320000)).
How to calculate Depth of Depletion Region Associated with Source?
With Built in Junction Potential o) & Doping Concentration of Acceptor (NA) we can find Depth of Depletion Region Associated with Source using the formula - Source's Depth of Depletion Region = sqrt((2*[Permitivity-silicon]*Built in Junction Potential)/([Charge-e]*Doping Concentration of Acceptor)). This formula also uses Permittivity of silicon, Charge of electron constant(s) and Square Root (sqrt) function(s).
Can the Depth of Depletion Region Associated with Source be negative?
No, the Depth of Depletion Region Associated with Source, measured in Length cannot be negative.
Which unit is used to measure Depth of Depletion Region Associated with Source?
Depth of Depletion Region Associated with Source is usually measured using the Meter[m] for Length. Millimeter[m], Kilometer[m], Decimeter[m] are the few other units in which Depth of Depletion Region Associated with Source can be measured.
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