Bulk Depletion Region Charge Density VLSI Formula

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Bulk Depletion Region Charge Density is defined as electric charge per unit area associated with the depletion region in the bulk of a semiconductor device. Check FAQs
QB0=-(1-(ΔLs+ΔLD2L))2[Charge-e][Permitivity-silicon][Permitivity-vacuum]NA|2Φs|
QB0 - Bulk Depletion Region Charge Density?ΔLs - Lateral Extent of Depletion Region with Source?ΔLD - Lateral Extent of Depletion Region with Drain?L - Channel Length?NA - Acceptor Concentration?Φs - Surface Potential?[Charge-e] - Charge of electron?[Permitivity-silicon] - Permittivity of silicon?[Permitivity-vacuum] - Permittivity of vacuum?

Bulk Depletion Region Charge Density VLSI Example

With values
With units
Only example

Here is how the Bulk Depletion Region Charge Density VLSI equation looks like with Values.

Here is how the Bulk Depletion Region Charge Density VLSI equation looks like with Units.

Here is how the Bulk Depletion Region Charge Density VLSI equation looks like.

-0.2006Edit=-(1-(0.1Edit+0.2Edit22.5Edit))21.6E-1911.78.9E-121E+16Edit|26.86Edit|
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Bulk Depletion Region Charge Density VLSI Solution

Follow our step by step solution on how to calculate Bulk Depletion Region Charge Density VLSI?

FIRST Step Consider the formula
QB0=-(1-(ΔLs+ΔLD2L))2[Charge-e][Permitivity-silicon][Permitivity-vacuum]NA|2Φs|
Next Step Substitute values of Variables
QB0=-(1-(0.1μm+0.2μm22.5μm))2[Charge-e][Permitivity-silicon][Permitivity-vacuum]1E+161/cm³|26.86V|
Next Step Substitute values of Constants
QB0=-(1-(0.1μm+0.2μm22.5μm))21.6E-19C11.78.9E-12F/m1E+161/cm³|26.86V|
Next Step Convert Units
QB0=-(1-(1E-7m+2E-7m22.5E-6m))21.6E-19C11.78.9E-12F/m1E+221/m³|26.86V|
Next Step Prepare to Evaluate
QB0=-(1-(1E-7+2E-722.5E-6))21.6E-1911.78.9E-121E+22|26.86|
Next Step Evaluate
QB0=-0.00200557851391776C/m²
Next Step Convert to Output's Unit
QB0=-0.200557851391776μC/cm²
LAST Step Rounding Answer
QB0=-0.2006μC/cm²

Bulk Depletion Region Charge Density VLSI Formula Elements

Variables
Constants
Functions
Bulk Depletion Region Charge Density
Bulk Depletion Region Charge Density is defined as electric charge per unit area associated with the depletion region in the bulk of a semiconductor device.
Symbol: QB0
Measurement: Surface Charge DensityUnit: μC/cm²
Note: Value can be positive or negative.
Lateral Extent of Depletion Region with Source
Lateral Extent of Depletion Region with Source the horizontal distance across which the depletion region extends laterally from the source terminal in a semiconductor device.
Symbol: ΔLs
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
Lateral Extent of Depletion Region with Drain
Lateral Extent of Depletion Region with Drain the horizontal distance across which the depletion region extends laterally from the drain terminal in a semiconductor device.
Symbol: ΔLD
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
Channel Length
Channel Length refers to the physical length of the semiconductor material between the source and drain terminals within the transistor structure.
Symbol: L
Measurement: LengthUnit: μm
Note: Value should be greater than 0.
Acceptor Concentration
Acceptor Concentration refers to the concentration of acceptor dopant atoms in a semiconductor material.
Symbol: NA
Measurement: Carrier ConcentrationUnit: 1/cm³
Note: Value should be greater than 0.
Surface Potential
Surface Potential is a key parameter in evaluating the DC property of thin-film transistors.
Symbol: Φs
Measurement: Electric PotentialUnit: V
Note: Value should be greater than 0.
Charge of electron
Charge of electron is a fundamental physical constant, representing the electric charge carried by an electron, which is the elementary particle with a negative electric charge.
Symbol: [Charge-e]
Value: 1.60217662E-19 C
Permittivity of silicon
Permittivity of silicon measures its ability to store electrical energy in an electric field, vital in semiconductor technology.
Symbol: [Permitivity-silicon]
Value: 11.7
Permittivity of vacuum
Permittivity of vacuum is a fundamental physical constant that describes the ability of a vacuum to permit the transmission of electric field lines.
Symbol: [Permitivity-vacuum]
Value: 8.85E-12 F/m
sqrt
A square root function is a function that takes a non-negative number as an input and returns the square root of the given input number.
Syntax: sqrt(Number)
abs
The absolute value of a number is its distance from zero on the number line. It's always a positive value, as it represents the magnitude of a number without considering its direction.
Syntax: abs(Number)

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How to Evaluate Bulk Depletion Region Charge Density VLSI?

Bulk Depletion Region Charge Density VLSI evaluator uses Bulk Depletion Region Charge Density = -(1-((Lateral Extent of Depletion Region with Source+Lateral Extent of Depletion Region with Drain)/(2*Channel Length)))*sqrt(2*[Charge-e]*[Permitivity-silicon]*[Permitivity-vacuum]*Acceptor Concentration*abs(2*Surface Potential)) to evaluate the Bulk Depletion Region Charge Density, The Bulk Depletion Region Charge Density VLSI formula is defined as electric charge per unit area associated with the depletion region in the bulk of a semiconductor device. Bulk Depletion Region Charge Density is denoted by QB0 symbol.

How to evaluate Bulk Depletion Region Charge Density VLSI using this online evaluator? To use this online evaluator for Bulk Depletion Region Charge Density VLSI, enter Lateral Extent of Depletion Region with Source (ΔLs), Lateral Extent of Depletion Region with Drain (ΔLD), Channel Length (L), Acceptor Concentration (NA) & Surface Potential s) and hit the calculate button.

FAQs on Bulk Depletion Region Charge Density VLSI

What is the formula to find Bulk Depletion Region Charge Density VLSI?
The formula of Bulk Depletion Region Charge Density VLSI is expressed as Bulk Depletion Region Charge Density = -(1-((Lateral Extent of Depletion Region with Source+Lateral Extent of Depletion Region with Drain)/(2*Channel Length)))*sqrt(2*[Charge-e]*[Permitivity-silicon]*[Permitivity-vacuum]*Acceptor Concentration*abs(2*Surface Potential)). Here is an example- -20.055785 = -(1-((1E-07+2E-07)/(2*2.5E-06)))*sqrt(2*[Charge-e]*[Permitivity-silicon]*[Permitivity-vacuum]*1E+22*abs(2*6.86)).
How to calculate Bulk Depletion Region Charge Density VLSI?
With Lateral Extent of Depletion Region with Source (ΔLs), Lateral Extent of Depletion Region with Drain (ΔLD), Channel Length (L), Acceptor Concentration (NA) & Surface Potential s) we can find Bulk Depletion Region Charge Density VLSI using the formula - Bulk Depletion Region Charge Density = -(1-((Lateral Extent of Depletion Region with Source+Lateral Extent of Depletion Region with Drain)/(2*Channel Length)))*sqrt(2*[Charge-e]*[Permitivity-silicon]*[Permitivity-vacuum]*Acceptor Concentration*abs(2*Surface Potential)). This formula also uses Charge of electron, Permittivity of silicon, Permittivity of vacuum constant(s) and , Square Root (sqrt), Absolute (abs) function(s).
Can the Bulk Depletion Region Charge Density VLSI be negative?
Yes, the Bulk Depletion Region Charge Density VLSI, measured in Surface Charge Density can be negative.
Which unit is used to measure Bulk Depletion Region Charge Density VLSI?
Bulk Depletion Region Charge Density VLSI is usually measured using the Microcoulomb per Square Centimeter[μC/cm²] for Surface Charge Density. Coulomb per Square Meter[μC/cm²], Coulomb per Square Centimeter[μC/cm²], Coulomb per Square Inch[μC/cm²] are the few other units in which Bulk Depletion Region Charge Density VLSI can be measured.
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