Thickness of Material in Integrated Circuits (IC) Formulas

Thickness of Material is the thickness of the given material. It refers to the physical dimension of an object measured perpendicular to its surface. And is denoted by t_high-k. Thickness of Material is usually measured using the Nanometer for Length. Note that the value of Thickness of Material is always positive.

Integrated Circuits (IC) formulas that make use of Thickness of Material

fxEquivalent Oxide ThicknessGo

FAQ

What is the Thickness of Material?

Thickness of Material is the thickness of the given material. It refers to the physical dimension of an object measured perpendicular to its surface. Thickness of Material is usually measured using the Nanometer for Length. Note that the value of Thickness of Material is always positive.

Can the Thickness of Material be negative?

No, the Thickness of Material, measured in Length cannot be negative.

What unit is used to measure Thickness of Material?

Thickness of Material is usually measured using the Nanometer[nm] for Length. Meter[nm], Millimeter[nm], Kilometer[nm] are the few other units in which Thickness of Material can be measured.

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