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Solid State Devices
Sample Thickness in Solid State Devices Formulas
Sample Thickness is defined as the total distance between the two planes of the sample taken. And is denoted by b. Sample Thickness is usually measured using the Micrometer for Length. Note that the value of Sample Thickness is always positive.
Solid State Devices formulas that make use of Sample Thickness
f
x
Absorbed Power
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f
x
Absorption Coefficient
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FAQ
What is the Sample Thickness?
Sample Thickness is defined as the total distance between the two planes of the sample taken. Sample Thickness is usually measured using the Micrometer for Length. Note that the value of Sample Thickness is always positive.
Can the Sample Thickness be negative?
No, the Sample Thickness, measured in Length cannot be negative.
What unit is used to measure Sample Thickness?
Sample Thickness is usually measured using the Micrometer[μm] for Length. Meter[μm], Millimeter[μm], Kilometer[μm] are the few other units in which Sample Thickness can be measured.
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