Junction Depth in VLSI Fabrication Formulas

Junction Depth is defined as the distance from the surface of a semiconductor material to the point where a significant change in the concentration of dopant atoms occurs. And is denoted by x_j. Junction Depth is usually measured using the Micrometer for Length. Note that the value of Junction Depth is always positive.

VLSI Fabrication formulas that make use of Junction Depth

fxJunction Depth after Full Scaling VLSIGo

fxShort Channel Threshold Voltage Reduction VLSIGo

FAQ

What is the Junction Depth?

Junction Depth is defined as the distance from the surface of a semiconductor material to the point where a significant change in the concentration of dopant atoms occurs. Junction Depth is usually measured using the Micrometer for Length. Note that the value of Junction Depth is always positive.

Can the Junction Depth be negative?

No, the Junction Depth, measured in Length cannot be negative.

What unit is used to measure Junction Depth?

Junction Depth is usually measured using the Micrometer[μm] for Length. Meter[μm], Millimeter[μm], Kilometer[μm] are the few other units in which Junction Depth can be measured.

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