Hole Carrier Lifetime in EDC Formulas

Hole Carrier Lifetime refers to the average time that a minority carrier hole exists in the material before recombining with an electron and thereby disappearing. And is denoted by τ_p. Hole Carrier Lifetime is usually measured using the Second for Time. Note that the value of Hole Carrier Lifetime is always positive.

EDC formulas that make use of Hole Carrier Lifetime

fxHole Diffusion LengthGo

FAQ

What is the Hole Carrier Lifetime?

Hole Carrier Lifetime refers to the average time that a minority carrier hole exists in the material before recombining with an electron and thereby disappearing. Hole Carrier Lifetime is usually measured using the Second for Time. Note that the value of Hole Carrier Lifetime is always positive.

Can the Hole Carrier Lifetime be negative?

No, the Hole Carrier Lifetime, measured in Time cannot be negative.

What unit is used to measure Hole Carrier Lifetime?

Hole Carrier Lifetime is usually measured using the Second[s] for Time. Millisecond[s], Microsecond[s], Nanosecond[s] are the few other units in which Hole Carrier Lifetime can be measured.

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