Depth of Sidewall in MOSFET Formulas

Depth of Sidewall refers to the distance from the surface of a structure or material to a specified point within the sidewall. And is denoted by x_j. Depth of Sidewall is usually measured using the Micrometer for Length. Note that the value of Depth of Sidewall is always positive.

MOSFET formulas that make use of Depth of Sidewall

fxZero Bias Sidewall Junction Capacitance per Unit LengthGo

FAQ

What is the Depth of Sidewall?

Depth of Sidewall refers to the distance from the surface of a structure or material to a specified point within the sidewall. Depth of Sidewall is usually measured using the Micrometer for Length. Note that the value of Depth of Sidewall is always positive.

Can the Depth of Sidewall be negative?

No, the Depth of Sidewall, measured in Length cannot be negative.

What unit is used to measure Depth of Sidewall?

Depth of Sidewall is usually measured using the Micrometer[μm] for Length. Meter[μm], Millimeter[μm], Kilometer[μm] are the few other units in which Depth of Sidewall can be measured.

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