Critical Dimension in Integrated Circuits (IC) Formulas

Critical Dimension in semiconductor manufacturing refers to the smallest feature size or the smallest measurable size in a given process. And is denoted by CD. Critical Dimension is usually measured using the Nanometer for Length. Note that the value of Critical Dimension is always positive.

Formulas to find Critical Dimension in Integrated Circuits (IC)

fxCritical DimensionGo

List of variables in Integrated Circuits (IC) formulas

fx Process Dependent Constant Go

fx Wavelength in Photolithography Go

fx Numerical Aperture Go

FAQ

What is the Critical Dimension?

Critical Dimension in semiconductor manufacturing refers to the smallest feature size or the smallest measurable size in a given process. Critical Dimension is usually measured using the Nanometer for Length. Note that the value of Critical Dimension is always positive.

Can the Critical Dimension be negative?

No, the Critical Dimension, measured in Length cannot be negative.

What unit is used to measure Critical Dimension?

Critical Dimension is usually measured using the Nanometer[nm] for Length. Meter[nm], Millimeter[nm], Kilometer[nm] are the few other units in which Critical Dimension can be measured.

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