Channel Width in VLSI Fabrication Formulas

Channel Width is defined as the physical width of the semiconductor channel between the source and drain terminals within the transistor structure. And is denoted by W_c. Channel Width is usually measured using the Micrometer for Length. Note that the value of Channel Width is always positive.

VLSI Fabrication formulas that make use of Channel Width

fxChannel Width after Full Scaling VLSIGo

fxShort Channel Saturation Current VLSIGo

fxNarrow Channel Additional Threshold Voltage VLSIGo

FAQ

What is the Channel Width?

Channel Width is defined as the physical width of the semiconductor channel between the source and drain terminals within the transistor structure. Channel Width is usually measured using the Micrometer for Length. Note that the value of Channel Width is always positive.

Can the Channel Width be negative?

No, the Channel Width, measured in Length cannot be negative.

What unit is used to measure Channel Width?

Channel Width is usually measured using the Micrometer[μm] for Length. Meter[μm], Millimeter[μm], Kilometer[μm] are the few other units in which Channel Width can be measured.

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